Tietz Video and Image Processing Systems GmbH

			CCD Cameras

			The detection quantum efficiency of electron image recording systems K.-H. Herrmann and D. Krahl Journal of Microscopy, Vol. 127, Pt 1, 1982 Performance of electron image converters with YAG single-crystal screen and CCD sensor I. Daberkow, K.-H. Hermann, L. Liu, W.D. Rau Ultramicroscopy 38 (1991) Methods to measure properties of slow-scan CCD cameras for electron detection W.J. de Ruijter and J.K. Weiss Rev. Sci. Instrum. 63 (10), October 1992 Performance of a low-noise CCD camera adapted to a TEM S. Kujawa and D. Krahl Ultramicroscopy 46 (1992) Applications of slow-scan CCD cameras in TEM O.L. Krivanek and P.E. Mooney, GATAN R&D Ultramicroscopy 49 (1993) Analysis of electron image detection efficiency of slow-scan CCD cameras Kazuo Ishizuka Ultramicroscopy 52 (1993) High-sensitivity lens-coupled slow-scan CCD camera for TEM G.Y. Fan and Mark H. Ellisman Ultramicroscopy 52 (1993) Development and performance of a fast fibre-plate coupled CCD camera at medium energy and image processing system for electron holography I. Daberkow, K.-H. Hermann, L. Liu, W.D. Rau, H. Tietz Ultramicroscopy 64 (1996) A large-area 2k x 2k fibre optic coupled slow-scan CCD camera of electron microscopy I. Daberkow, G. Lang, H. Tietz European Congress on Electron Microscopy, Dublin (1996) The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection Rüdiger Meyer, Angus Kirkland Ultramicroscopy 75 (1998) Easy methods for accurate characterization of CCD cameras C. Hülk and I. Daberkow International Congress on Electron Microscopy, Cancun (September 1998)

			Tomography and autoalignment

			Fast and accurate autotuning of a TEM for high resolution and low dose electron microscopy A.J. Koster, D. Typke and M.J.C. de Jong Proceedings of the XIIth International Congress for Electron Microscopy 1990 A system for automated electron tomography using Philips CM series Transmission Electron Microscopes I. Daberkow, A.J. Koster, H.R. Tietz, D. Typke, J. Walz Philips Electron Optics Bulletin 134 (1996) Practical autoalignment of transmission electron microscopes A. J. Koster and W. J. De Ruijter Ultramicroscopy(1992) Towards automatic electron tomography K. Dierksen, D. Typke, R. Hegerl, A.J. Koster, W. Baumeister Ultramicroscopy 40(1992) The EM Program Package: A Platform for Image Processing in Biological Electron Microscopy R. Hegerl Journal of Structural Biology 116 (1996) Electron Tomography Edited by Joachim Frank Plenum Press, New York, 1992

			Electron Holography

			Correction of the aberrations of an electron microscope by means of electron holography Q. Fu, H. Lichte, E. Voelkl Phys. Rev. Lett. 67 (1991) Real-time reconstruction of electron off-axisholograms recorded with a high pixel CCD-Camera W. Rau, H. Lichte, E. Voelkl, U. Weierstall J. Comp. Ass. Micr. (1991), Vol. 3, No. 2 Reconstruction of electron holograms W. Rau MSA Bulletin (1994)

			Focal Variation Method

			New direct methods for phase and structure retrieval in HREM D. Van Dyck Proceedings XIIth Intern. Congr. for Electron Micr., Seattle (1990) Phase retrieval through focus variation for ultraresolution in field-emission TEM W. Coene, G. Janssen, M. Op de Beck, D. Van Dyck Phys. Rev. Lett. (1992), Vol. 29, No. 26 A new approach to object wavefunction reconstruction in HRTEM D. Van Dyck, M. Op de Beck, W. Coene to be published in a special B/E issue of Ultramicroscopy 1994

			TVIPS publications

			On-line image processing in real time for transmission electron microscopy H.R. Tietz, MPI Martinsried Journal de Microscopie et de Spectroscopie Electroniques, Volume 11, 1986 TEMDIPS a New and Powerful Image Processing System for Transmission Electron Microscopy H.R. Tietz Optik 77 (Supplement 3) (1987) Emploi d´un processeur FFT a temps de reponse de l´ordre de la seconde en microscopie electronique F.Oudet et A. Vejux, Service d´Analyse physico-Chimique, Université de Compiéngne, BP 649, 60206 Compiéngne Cedex, H. R. Tietz, MPI Martinsried J. Microsc. Spectrosc. Electron., Vol. 13, 1988 Principles and practice of on-line data acquisition for transmission electron microscopy H.R.Tietz Proceedings of the XIIth International Congress for Electron Microscopy 1990 Measurement of the spherical aberration coefficient of transmission electron microscopes by beam-tilt-induced image displacements A.J. Koster, A.F. de Jong, TVIPS GmbH, Philips Eindhoven Ultramicroscopy 38 (1991) Measurement of Electron-Optical parameters for high-resolution electron microscopy image interpretation A. F. de Jong and A. J. Koster, TVIPS GmbH, Philips Nat. Lab. Eindhoven Abstract 10th Pfefferkorn Conference (1991) FEG in TEM: the route to HREM W. Coene, A.F. de Jong, H. Lichte, H. Tietz, D. Van Dyck Proceedings of X European Congress on Electron Microscopy, (1992) Granada Present status and future prospects of TEM camera systems, on line image processing and TEM control H. R. Tietz Proceedings of X European Congress on Electron Microscopy, (1992) Granada