FastScan-F114 cameras combine the superior quality of a slow scan CCD camera with the fast frame rate of a video camera.
Various mechanical designs make the FastScan-F114 cameras suitable for almost all TEMs, even when using different accessories such as PEELS, post-column energy filters, STEM detectors or wide-angle cameras. The frame transfer CCD chip allows the FastScan-F114 to operate without a beam shutter.
- 1024 × 1024 CCD camera
- Fiber-optical coupling (1:1 or 2:1 tapered)
- Video rate at 512 × 512 pixel
- Optimized for high tensions up to 400 kV
FastScan-F114On-axis, 1:1 fiber-optics, available for all TEMs with adaptors in the bottom plate
FastScan-F114TOn-axis, 2:1 tapered fiber-optics, available for all TEMs with an aperture of at least 45 mm diameter in the bottom plate
FastScan-F114TRRetractable camera with a 2:1 tapered fiber-optics located in the camera chamber (available for JEOL microscopes only)
FastScan-F114On-axis, 1:1 fiber-optics, available for specials adaptors
FastScan-F114TNear-axis, compatible with post-column energy-filters, PEELS, or other TVIPS on-axis cameras
FastScan-F114TROff-axis, compatible with post-column energy filters, PEELS, or on-axis cameras (FEI/Philips only)
| SPECIFICATIONS | F114 | F114NX | F114T |
|---|---|---|---|
| * Typical Values | |||
| CCD Type (architecture) | Frame Transfer | ||
| CCD Format (pixel) | 1024 × 1024 | ||
| CCD Pixel Size (μm) | 14 × 14 | ||
| Field Of View (mm) | 14.3 × 14.3 | 14.3 × 14.3 | 28.6 × 28.6 |
| Readout Rate @ 12 bit | 20 Mpixel/sec | ||
| Frame Rate At Full Resolution | 12 frames/sec | ||
| Frame Rate At 2 × Binning | 26 frames/sec (image size 512 × 512 pixels) | ||
| Post Magnification | 1.1 × – 1.5 × | ||
| Electron-Optical Coupling | 1:1 fiber-optics | 1:1 fiber-optics | 2:1 taper |
| Scintillator Type | Polycrystalline Phosphor | ||
| Sensor Cooling | < -10˚ C, regulated | ||
| Binning Factors | 1×, 2× | ||
| Gain Factors (analog) | 1× | ||
| Full Well Capacity (electrons) | 230000 | ||
| Dynamic Range* | 2.500 : 1 | ||
| Non-Liniarity (after flatfield correction) |
< 2% | ||
| Sensitivity for primary electrons (120kV scintillator)* |
3.0 counts | 3.0 counts | 1.5 counts |
| SNR (for a single 120keV electron)* |
3.0 | 3.0 | 1.5 |
| Resolution (NTF at Nyquist Frequency)* |
> 10% | > 10% | > 13% |
| Anti-Blooming | yes | ||
| Bottom Mounted | on-axis | near-axis | on-axis, rotatable |
| System Requirements | MS Windows 7, English | ||
| Software | EM-Menu Image Processing software, Tomography | ||